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ICT test probe (CPM-100S)

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Offer price breaks when you order a larger quantify.

Leading time would be depends on our work efficiency and delivery schedule, usually within 2 business days.

Shipping: Ships in 2 business day

Workstation

The tool workbench is made of aluminum profiles as raw materials, using a variety of aluminum profiles, cutting precision, It is easy to process, and the surface is not rusty. It can be combined with various materials and accessories to assemble into various Various styles of workbenches are beautiful and portable, easy to disassemble and assemble, flexible to adjust, and can be customized on demand.

It does not require maintenance and is widely used in various industrial production industries.


safety & guarding

Aluminum profile small shield Product classification: Industrial fence/protection case The whole is made of aluminum profile 4040 and frosted pc board. The overall appearance is beautiful and atmospheric, relatively stable, and the size can be customized according to requirements


Machine Enclosure Machine Frame

The automobile inspection fixture frame is assembled with aluminum profiles and accessories, and the product is designed according to customer requirements Appropriate frame structure, using heavy-duty profiles and supporting connectors, beautiful products , Atmosphere, high strength, please consult APS online customer service for details


ICT Test Probes by Equip-test -

Cable Test Probes- Ø0,9- Plating- Material- Ø1,37 (-054) Available Tip Styles- Solderable- Mounting and Functional Dimensions- ICT / FCT- Long-stroke Test Probe for dual-Stage Fixtures- e-type ---

ICT Multi-Stage Test Fixture - Circuit

The design uses the tester’s two vacuum ports to independently control the fixture’s two stages and can accommodate up to 400 long stroke probes and 3000 short stroke probes. Conventional probe spacing of 100 – 39mil and socket!less spacing of 75 – 31mil are available.

What is ICT: In-Circuit Test » Electronics

In!Circuit Test, ICT is a powerful tool for printed circuit board test· Using a bed of nails in!circuit test equipment it is possible gain access to the circuit nodes on a board and measure the performance of the components regardless of the other components connected to them·

Home - S-HUNG ENTERPRISE CO.,

S-HUNG Enterprises Co:· Ltd: was established in 2017: Our team has more than 20 years of experience in the field of probe testing: Through the integration of OEM and Know How for probe related products· we have established our own brand and cooperated with many advanced electronics technology companies in Taiwan· Japan· and the Mainland China to help customers improve yield during testing :::

Digitaltest

the experts for In;Circuit;Test, Flying Probe and Software As a leading partner in the electronics industry, Digitaltest develops and produces automated test systems (ATE) for electronic circuit boards, software for automating production, and quality management systems.

Spring Contact Probe, ICT Switch Probe, PCB Test Probe - Chip

ICT Probes, TOP039 TOP039|L1 TOP039|L2 TOP050 TOP050|L TOP050|S1 TOP050|S2 TOP075 TOP075|L TOP075|S TOP100 TOP100|L1 TOP100|L2 TOP100|S1 TOP100|S3 TOP125 TOP156 TOP187 Switch Probes, SWTOP3 SWTOP4 SWTOP5 PCB Test Probes, TOP0 TOP1 TOP20 TOP30 TOP40 TOP50 TOP60 TOP70 High Current Probe, CTOP33 CTOP100 CTOP125 CTOP156 CTOP187 Battery Probe, BP0 ___

Rotating test probes -

Rotating test probes are recommended for the secure contact of heavily contaminated components, anodised aluminium, or similar plated surfaces. During the contacting process, the rotating plunger of the test probe pierces the surface of the PCB reliably penetrating the contact surface.

TestJet/VTEP Hardware Description and

† Hanger probes must be installed correctly on the AMP board: The correct side for installation is identified by the masked test pad (Figure 2): † The socket for the signal hanger probe is near the masked test pad: † The socket for the ground hanger probe is at the opposite corner of the AMP board: Figure 2 AMP board – connections to :::

Bead probe technology - increase ICT test coverage-Seamark ZM

The purpose of Agilent is of course to hope that the entire electronics industry can continue to maintain ICT operations, and purchase more of its 3070 series ICT test machine from them. PCB assembly increase ICT test coverage. The traditional ICT test method uses a pointed probe to form a loop on a circular test point.