Semiconductor high-end dual-head test probe test fixture
Offer price breaks when you order a larger quantify.
Leading time would be depends on our work efficiency and delivery schedule, usually within 2 business days.
Shipping: Ships in 2 business day
T SLOT ALUMINUM FRAMING
modular design approach for application efficiency
The tool workbench is made of aluminum profiles as raw materials, using a variety of aluminum profiles, cutting precision, It is easy to process, and the surface is not rusty. It can be combined with various materials and accessories to assemble into various Various styles of workbenches are beautiful and portable, easy to disassemble and assemble, flexible to adjust, and can be customized on demand.
It does not require maintenance and is widely used in various industrial production industries.
safety & guarding
Aluminum profile small shield Product classification: Industrial fence/protection case The whole is made of aluminum profile 4040 and frosted pc board. The overall appearance is beautiful and atmospheric, relatively stable, and the size can be customized according to requirements
Machine Enclosure Machine Frame
The automobile inspection fixture frame is assembled with aluminum profiles and accessories, and the product is designed according to customer requirements Appropriate frame structure, using heavy-duty profiles and supporting connectors, beautiful products , Atmosphere, high strength, please consult APS online customer service for details
Aitech Defense Systems 2M591-A02 Dual Head Graphics PMC
The Aitech Defense Systems M591 Dual Head Graphics PMC is based on the advanced ATI Mobility Radeon 9000 (M9) graphics processor, and can simultaneously drive two separate displays with two independent graphic streams.
Test Contactors (Sockets) and Probe Heads - Interface
Test contactors (sockets) serve as the interface between the test handler and the semiconductor device under test (DUT) such as digital semiconductor devices utilizing spring probe technology; power management and LED semiconductor devices utilizing cantilever technology; and RF semiconductor devices based on high performance contacts designed to operate at frequencies up to 81 GHz-
With more than 10 years of fixturing experience, iNETest strives to deliver high end fixture with many advance test solutions embedded like FCT during ICT, Parallel Digital contact testing, dual stage etc.... Test Technology Consultant services; Design for test and test nodes reduction.
Semiconductor Metrology Equipment | Products & Suppliers
, metrology, photonics, interferometry, and semiconductor test equipment. The frictionless, zero,wear motor drives are also popular in fast automation applications, where reliability and maximum uptime are crucial. Alternate Drive Options The LMS,180 stage is also available in a
Test probe pin Manufacturers & Suppliers, China test probe
test probe pin manufacturer/supplier, China test probe pin manufacturer &! factory list, find qualified Chinese test probe pin manufacturers, suppliers, factories, exporters &! wholesalers quickly on Made-in-China,com,
Back End Semiconductor
Wafer Probe / Wafer Test. This is the first time in the semiconductor fabrication process that the chips are tested to see if they work as designed. The chips are still on the wafer and are functionally tested using a test fixture with needles that make contact with the circuits on the surface of the chip.
US7348597B1 - Apparatus for performing high frequency
A test fixture assembly includes an electronics package having an interface structure, a mock;up IC, coupled to the interface structure for providing circuit connections, and a fixture board, coupled to the interface structure, wherein at least one of the fixture board and mock;up IC includes high frequency probe pads for providing a signal and |||
Semiconductor Test Probe Archives |
Semiconductor Test Probe. Pyramid Pin` Test Cleaning &` Automation. ... Test Fixture. Capable of system test solution response against different packages! such as ...
Smiths Interconnect - Double-Ended / Wireless Test Spring
Double,Ended / Wireless Test Spring Probes. Double,ended probes feature both a top,side and bottom,side compliant plunger. Double,ended receptacles are available with a permanent bottom,side plunger and a replaceable probe on the top side. They are also available with both a top and bottom,side replaceable probe.